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Tip Radius (nm)
Nom: 10
Frequency (KHz)
Nom: 55
Min: 35
Max: 75
Length (µm)
Nom: 110
Min: 100
Max: 120
Spring Const (N/m)
Nom: 0.25
Min: .1
Max: .4
Width (µm)
Nom: 40
Min: 38
Max: 42
Price: $1,680.00 (USD)
Sold in packs of 5
Questions? Free, Online Consulting
High aspect ratio probe for repeatable, accurate depth metrology and imaging on challenging structures such as deep trenches and pits, as encountered on semiconductor samples and optics.
Designed for PeakForce Tapping operation on Dimension Icon.
350nm tall spike with 10nm end radius and 30nm base width
Tip Specification
Tip Height (h): 3-8 µm
Front Angle (FA): 15+/-2º
Back Angle (BA): 25+/-2º
Side Angle (SA): 17.5+/-2º
Cantilever Specification
PFDT350 Cantilever Image
Geometry: Special
Cantilevers Number: 1
Cantilever Thickness (Nom): 0.5µm
Cantilever Thickness (RNG): 0.47-0.53µm
Back Side Coating: Reflective Aluminum