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Tip Radius (nm)
Nom: 30
Frequency (KHz)
Nom: 130
Min: 100
Max: 160
Length (µm)
Nom: 60
Min: 55
Max: 65
Spring Const (N/m)
Nom: 0.4
Min: 0.2
Max: 0.6
Width (µm)
Nom: 30
Min: 27
Max: 33
Price: $1,575.00 (USD)
Sold in packs of 5
Questions? Free, Online Consulting
High aspect ratio probe for repeatable, accurate depth metrology and imaging on challenging structures such as deep trenches and pits, as encountered on semiconductor samples and optics.
Designed for PeakForce Tapping operation on Dimension Icon.
2500nm tall spike with 30nm end radius and 150nm base width
Tip Specification
PFDT2500 Tip Image
Tip Height (h): 3-8 µm
Front Angle (FA): 15+/-2º
Back Angle (BA): 25+/-2º
Side Angle (SA): 17.5+/-2º
Cantilever Specification
PFDT2500 Cantilever Image
Geometry: Special
Cantilevers Number: 1
Cantilever Thickness (Nom): 500µm
Cantilever Thickness (RNG): 470-530µm
Back Side Coating: Reflective Aluminum