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PFDT750

PFDT750
Geometry
Rectangular
Tip Radius (nm)
Nom: 10
Frequency (KHz)
Nom: 130
Min: 100
Max: 160
Length (µm)
Nom: 60
Min: 55
Max: 65
Spring Const (N/m)
Nom: 0.4
Min: 0.2
Max: 0.6
Width (µm)
Nom: 30
Min: 27
Max: 33
Price: $1,125.00 (USD)
Sold in packs of 5
+
-
Questions? Free, Online Consulting
Overview
High aspect ratio probe for repeatable, accurate depth metrology and imaging on challenging structures such as deep trenches and pits, as encountered on semiconductor samples and optics.

Designed for PeakForce Tapping operation on Dimension Icon.

750nm tall spike with 10nm end radius and 65nm base width
Tip Specification
Tip Height (h): 3-8 µm
Front Angle (FA): 15+/-2º
Back Angle (BA): 25+/-2º
Side Angle (SA): 17.5+/-2º
Cantilever Specification
PFDT750 Cantilever Image
Geometry: Special
Cantilevers Number: 1
Cantilever Thickness (Nom): 0.5µm
Cantilever Thickness (RNG): 0.47-0.53µm
Back Side Coating: Reflective Aluminum
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