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Frequency (KHz)
Nom: 19
Min: 17
Max: 21
Length (µm)
Nom: 300
Min: 295
Max: 305
Spring Const (N/m)
Nom: 1.0
Min: 0.8
Max: 1.2
Width (µm)
Nom: 50
Min: 47
Max: 53
Price: $865.00 (USD)
Sold in packs of 5
Questions? Free, Online Consulting
Coaxially shielded probe with a solid metal probe tip, from Prime Nano Inc (model 5-300N), to work with the Scanning Microwave Impedance Microscopy module. This 300um long, 1N/m probe is recommended for contact mode measurements and sub resonant intermittent contact modes like force volume and Peak Force Tapping. Pack of 5 probes.
Tip Specification
SMIM-300 Tip Image
Tip Height (h): 4.5 - 5.5 µm
Front Angle (FA): 35 ± 1º
Back Angle (BA): 35 ± 1º
Side Angle (SA): 35 ± 1º
Cantilever Specification
SMIM-300 Cantilever Image
Material: Silicon Nitride
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.6µm
Cantilever Thickness (RNG): 3.3 - 3.9µm
Back Side Coating: TiW/Au (500)