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Tip Radius (nm)
Nom: 8
Max: 12
Frequency (KHz)
Nom: 190
Min: 130
Max: 250
Length (µm)
Nom: 225
Min: 215
Max: 235
Spring Const (N/m)
Nom: 48
Min: 24
Max: 96
Width (µm)
Nom: 40
Min: 38
Max: 42
Order a free LTESPA-V2 sample
Price: $367.20 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
A pack of 10 High quality long-lever etched silicon probes for TappingMode™ and othernon-contact modes.  Unmounted for use on standard AFM's.

Bruker AFM Probes has introduced an improved version of its popular,LTESP/LTESPA AFM probes. Bruker’s new line of LTESP high quality premiumetched silicon probes set the industry standard for long-lever TappingMode™ andnon-contact mode in air.  

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model LTESP-V2.  

Tip Specification
LTESPA-V2 Tip Image
Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5º
Side Angle (SA): 22.5 ± 2.5º
Cantilever Specification
LTESPA-V2 Cantilever Image
Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 6.8µm
Cantilever Thickness (RNG): 5.8 - 7.8µm
Back Side Coating: Reflective Aluminum