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Probes → OSCM-PT-R4

OSCM-PT-R4

OSCM-PT-R4
Geometry
Rectangular
Tip Radius (nm)
Nom: 20
Max: 25
Frequency (KHz)
Nom: 70
Min: 50
Max: 90
Length (µm)
Nom: 240
Min: 225
Max: 255
Spring Const (N/m)
Nom: 2
Min: 0.64
Max: 3.51
Width (µm)
Nom: 40
Min: 38
Max: 42
2 Total Related Products
CONTV-PT
A pack of Conductive Silicon Probes. 

Bruker's Value Line Probe for Electrical Characterization using Contact Mode in air.

Specifications:
- Tip radius of 25 nm nominal.
- Platinum-Iridium coated, electrically conductive tip that is ideal for various electrical characterization applications.
-The Pt-Ir coating on the front side of the cantilever provides a metallic electrical path from the cantilever die to the apex of the tip.
- The coating on the back side of the cantilever enhances laser reflectivity.
- Unmounted for all AFMs.View...
SCM-PTSI
For the highest resolution nanoelectrical measurements with outstanding wear resistance.

Bruker's platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements, conductivity measurements (Conductive AFM (C-AFM) and PeakForce TUNA), Electrical Force Microscopy (EFM), and other characterization applications. on the most advanced semiconductor features, providing the highest resolution imaging and long tip lifetime due to its outstanding wear resistant properties. 

The Bruker SCM-PtSi probe provides:

• High resolution electrical imaging with an ultra-sharp conductive tip
• Consistent performance with high measurement lifetime
• Highly sensitive nanoelectrical measurements

Bruker Atomic Force Microscopy group also provides many other nano-electrical probes and modes for AFM based electrical measurements including our unique PeakForce KPFM & PeakForce TUNA modes.


View...
Order a free OSCM-PT-R4 sample

Please note that we are only able to offer samples for shipping addresses within the United States of America.

Price: $540.00 (USD)
Sold in packs of 10
+
-
Shipping Info
Probe Selection Guide
Email Us
Questions? Free, Online Consulting
+1 (800) 715-8440
Overview
OSCM-PT-R4 series probes have platinum-deposited cantilevers and are suitable for conducting scanning probe microscopy in air using electric force microscopy (EFM) or Kelvin probe force microscopy (KFM) modes, with an unprecedented sharpness of 20nm radius as a metal coated probe.

These probes feature:
 

1) High resolution:
The apex of 20 nm (typ.) radius is prominently sharp among metal-coated probes (see the tip apex). The thin and sharp tetrahedral probe reveals sample surface precisely both electrically and topographically.

2) Visible apex tip:
OSCM-PT-R4 has a tetrahedral tip on the exact end of the cantilever. Since the tip isn't hidden by the body of cantilever, it canbe positioned exactly at a point of interest using an optica lmicroscopy.

 

 

Tip Specification
OSCM-PT-R4 Tip Image
Tip Height (h): 9 - 19 µm
Front Angle (FA): 0 ± 1º
Back Angle (BA): 35 ±1º
Side Angle (SA): 18 ±1º
Cantilever Specification
OSCM-PT-R4 Cantilever Image
Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.02 Ωcm Silicon
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.3µm
Cantilever Thickness (RNG): 1.6 - 3.0µm
Back Side Coating: Reflective Aluminum
Top Layer Back: 100 nm of Al
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