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Probes → VITA-HE-NANOTA-200

VITA-HE-NANOTA-200

VITA-HE-NANOTA-200 View Larger
Geometry
Thermal
Frequency (KHz)
Nom: 78
Min: 55
Max: 100
Length (µm)
Nom: 200
Min:
Max:
Spring Const (N/m)
Nom: 2.5
Min: 0.5
Max: 4.6
4 Total Related Products
VITA-TS-STHM

SThM test sample comprising of carbon fibers embedded in epoxy and cross sectioned. The fiber and epoxy regions give contrast variation over a variety of scanning modes.

Topographic view:    Thermal view:

   

 


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VITA-CS-NANOTA
VITA nTA Calibration Sample Set consisting of three polymer samples with known transition temperatures. These sample allow for temperature calibration of each nTA probe.

The melt transitions for each of them are:
a) Think film samples of polycaprolactone (PCL, Tm = 55º C)
b) High density polyethylene (HDPE, Tm = 116º C)
c) Polyethylene terephthalate (PET, Tm = 235º C)
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VITA-HE-NANOTA-300

NanoTA probes for MultiMode, Innova, and Caliber SPMs, 300 micron length.

Note:
Requires specialized probe holder model VITA-CH-IN when used withInnova/Caliber AFMs, and holder model VITA-CH-MM-HE when used withMultiMode AFMs.
Specifically designed for use with VITA module.  Uses other than with VITA module void probe warranty.

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VITA-HE-GLA-1
SThM probes for MultiMode, Innova and Caliber SPMs, 150 micron length.

Note:
Requires specialized probe holder model VITA-CH-IN when used with Innova/Caliber AFMs, and holder model VITA-CH-MM-HE when used with MultiMode AFMs.
Specifically designed for use with VITA module.  Uses other than with VITA module void probe warranty.
Highly static sensitive.  Do not measure resistance with conventional resistance meters.
Not compatible with previous generation SThM application modules.
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Price: $2,415.00 (USD)
Sold in packs of 5
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Shipping Info
Probe Selection Guide
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Overview
NanoTA probes for MultiMode, Innova, and Caliber SPMs, 200 micron length.

Note:
Requires specialized probe holder model VITA-CH-IN when used withInnova/Caliber AFMs, and holder model VITA-CH-MM-HE when used withMultiMode AFMs.
Specifically designed for use with VITA module.  Uses other than with VITA module void probe warranty.
Tip Specification
VITA-HE-NANOTA-200 Tip Image
Probes are micro-machined silicon probes; similar in geometry to standard Silicon AFM probes but incorporate a resistive heater at the end of the cantilever. These probes have the capability to image the sample surface significantly better than most thermal probes. Probes can be heated repeatedly and reliably to higher temperatures (350°C) than other thermal probes made of thin metal films. Note: Requires specialized probe holder (part of the VITA module) when used with Innova AFM. Specifically designed for use with VITA module. Uses other than with VITA module void probe warranty.
Tip Height (h): 3-6 µm
Cantilever Specification
VITA-HE-NANOTA-200 Cantilever Image
Material: Silicon
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2µm
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