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Tip Radius (nm)
Nom: 10
Max: 12
Frequency (KHz)
Nom: 40
Min: 25
Max: 55
Length (µm)
Nom: 300
Min: 290
Max: 310
Spring Const (N/m)
Nom: 1
Min: 0.3
Max: 2
Width (µm)
Nom: 25
Min: 20
Max: 30
Price: $600.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
A pack of HarmoniX Probes
"Soft" version for nanoscale material property mapping of softer samples in the 0.5MPa to 1GPa hardness range. HMXS are significantly softer (about 5x) than HMX but with similar bandwidth.  This makes HMXS better for:
+ Adhesion measurements where background noise can dominate.  These probes are about 5x more sensitive (background noise levels of a few hundred pN).
+ High resolution on softer materials where peak forces must be small to control sample deformation
+ Stiffness measurements on softer materials.
HMX probes are better for stiffer samples and sticky samples where the tip can get stuck to the surface.  Unmounted for HamorniX-enabled, NS5-based AFMs.
Tip Specification
These probes are the characteristic "off-axis" design specific to the Veeco HarmoniX mode. The torsional/flexural spring constant is 17N/m.
Tip Height (h): 4 - 10 µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5º
Side Angle (SA): 22.5 ± 2.5º
Cantilever Specification
Aluminum reflective coating on the backside of the cantilever is standard. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3µm
Cantilever Thickness (RNG): 2.0 - 3.5µm
Back Side Coating: Reflective Aluminum
Top Layer Back: 40 ± 10 nm of Al