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Tip Radius (nm)
Nom: 10
Max: 12
Frequency (KHz)
Nom: 60
Min: 45
Max: 75
Length (µm)
Nom: 300
Min: 310
Max: 290
Spring Const (N/m)
Nom: 4
Min: 1
Max: 6
Width (µm)
Nom: 25
Min: 20
Max: 30
Price: $600.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
A pack of HarmoniX Probes.
For nanoscale material property mapping of standard samples in the 10MPa to 10GPa hardness range. HMX probes are preferred over HMXS version probes for stiffer and sticky samples where the tip can get more easily stuck to the surface.  Unmounted for HamorniX-enabled, NS5-based AFMs.
Tip Specification
HMX-10 Tip Image
These probes are the characteristic "off-axis" design specific to the Veeco HarmoniX mode. The torsional/flexural spring constant is 17N/m.
Tip Height (h): 4 - 10 µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5º
Side Angle (SA): 22.5 ± 2.5º
Cantilever Specification
HMX-10 Cantilever Image
Aluminum reflective coating on the backside of the cantilever is standard. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications. Frequency Ratio Ft/Fo: 17
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 4µm
Cantilever Thickness (RNG): 3.0 - 5.3µm
Back Side Coating: Reflective Aluminum
Top Layer Back: 40 ± 10 nm of Al