Your shopping cart is currently empty.
Test Samples
One way to verify that your AFM is operating correctly is to test the instrument's imaging capability or data collection on a sample with known properties. Test samples are typically used to demonstrate the sample's properties in a particular application or imaging mode.
EFM Test Sample on 18 mm Puck for Innova and CP/CP-II; This sample is conductive and allows a bias potential to be applied between the tip and sample. This allows an E-field to be imaged in Lift Mode.