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By AFM
Accessories sorted by AFM. Please choose your AFM model from the list on the left.
SPM cross-sectional sample holder
EFM test sample on 18 mm puck for Innova and CP/CP-II.
TRmode Cantilever Holder for TUNA, CAFM or SSRM
Titanium roughness sample
Calibration artifact: grating for CP & CP-II
Electrochemistry TappingMode fluid cell
Replacement scanner springs for AS-130 and AS-200 type scanners
Replacement scanner springs for AS-0.5 and AS-12 type scanners
Calibration artifact: 180nm step height, 10µm pitch
Calibration Artifact: 100nm Depth, 1µm Pitch, Pt Coated, on 18mm Puck
MFM starter kit for Dimension series SPMs
Calibration Artifact: 180nm Depth, 10μm Pitch, Pt Coated, on 15mm Puck
Micro-vise sample holder for polymer & other soft materials
Peak Force QNM Sample Kit, Samples on 12mm discs
Cover Glass for Second Generation Dimension EC Cell