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MultiMode®

The legendary performance and reliability of the MultiMode platform is the result of both its superior mechanical design and the industry’s lowest noise control electronics. The secret to its continued presence at the leading edge of AFM research is its ability to incorporate all the latest technology advances.
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SD-104
SPM sample mounting disks, 6mm diameter.  Qty 50.
SPRING-L
Replacement scanner springs for AS-130 and AS-200 type scanners, MultiMode SPM. These springs suppl...
SPRING-S
Replacement scanner springs for AS-0.5 and AS-12 type scanners, MultiMode SPM. These springs supply...
SPRING-V
Replacement scanner springs for all V and VLH type scanners, MultiMode SPM. These springs supply te...
SSRM-SMPL-N
Unmounted n-type staircase SSRM sample.  PLEASE NOTE: Sample cross-sectioning by cleaving or po...
SSRM-SMPL-OX
Unmounted Oxide sample. PLEASE NOTE: Sample cross-sectioning by cleaving or polishing is require...
SSRM-SMPL-P
Unmounted p-type staircase SSRM sample. PLEASE NOTE: Sample cross-sectioning by cleaving or poli...
STKYDOT
A full package of adhesive pads for mounting samples on to steel mounting disks. These are 36 adhes...
STOR1
Tip storage kit provides convenient storage for individual tips from whole wafers. Includes one she...
STOR2
Tip storage kit with gel for silicon nitride cantilevers. This tip storage kit provides convenient ...
STR10-1800P
Calibration artifact, 180nm step height, 10µm pitch. This VLSI Surface Topography Reference Dies ha...
STR10-180P
Calibration artifact: 18nm step height, 10µm pitch. This VLSI Surface Topography Reference Dies hav...
STR10-440P
Calibration artifact: 44nm step height, 10µm pitch. This VLSI Surface Topography Reference Dies hav...
STR3-1000P
Calibration artifact: 100nm step height, 3µm pitch. This VLSI Surface Topography Reference Dies hav...
STR3-1800P
Calibration artifact: 180nm step height, 3µm pitch. This VLSI Surface Topography Reference Dies hav...
STR3-180P
Calibration artifact: 18nm step height, 3µm pitch. This VLSI Surface Topography Reference Dies have...
STR3-440P
Calibration artifact: 44nm step height, 3µm pitch. This VLSI Surface Topography Reference Dies have...
STS3-1000P
Calibration artifact: 100nm step height, 3/10/20µm pitch, NIST traceable. These VLSI surface topogr...
STS3-1800P
Calibration artifact: 180nm step height, 3/10/20µm pitch, NIST traceable. These VLSI surface topogr...
STS3-180P
Calibration artifact: 18nm step height, 3/10/20µm pitch, NIST traceable. These VLSI surface topogra...
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