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Tip Radius (nm)
Nom: 7.0
Max: 10.0
Frequency (KHz)
Nom: 70
Min: 50
Max: 90
Length (µm)
Nom: 240
Min: 225
Max: 255
Spring Const (N/m)
Nom: 2
Min: 0.6
Max: 3.5
Width (µm)
Nom: 40
Min: 38
Max: 42
Order a free OLTESPA-R4 sample
Price: $446.25 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
The OLTESPA-R4 is a visible apex tip. Just point the free end of the cantilever at the sample feature of interest when in the navigation GUI of your AFM and hit engage.

The tip located directly beneath the cantilever apex will land in the perfect position for scanning every time!
The probe also features a tetrahedral sharpened tip with a 7nm tip radius for crisp topographic images.
A 70khz resonant frequency and 2N/m spring constant make this probe perfect for gentle imaging of samples in tapping mode whilst maintaining tip sharpness.
Suitable for a wide range of polymeric, metallic, semiconductor, ceramic and similar samples.
Tip Specification
OLTESPA-R4 Tip Image
The probe tip is a sharpened tetrahedral. The tip is fabricated on the exact end of each probe.
Tip Height (h): 9 - 19 µm
Front Angle (FA): 0 º
Back Angle (BA): 35º
Side Angle (SA): 18º
Cantilever Specification
OLTESPA-R4 Cantilever Image
Material: 0.01 - 0.02 Ωcm Silicon
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.3µm
Cantilever Thickness (RNG): 1.6 - 3.0µm
Back Side Coating: Reflective Al