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Tip Radius (nm)
Nom: 7
Frequency (KHz)
Nom: 300
Min: 200
Max: 400
Length (µm)
Nom: 160
Min: 145
Max: 175
Spring Const (N/m)
Nom: 26
Min: 8.4
Max: 57
Width (µm)
Nom: 40
Min: 38
Max: 42
Price: $420.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting

  The OTESPA-R4 is a visible apex tip. Just point the free end of the cantilever at the sample feature of interest when in the navigation GUI of your AFM and hit engage.

The tip located directly beneath the cantilever apex will land in the perfect position for scanning every time!
The probe also features a tetrahedral sharpened tip with a 7nm tip radius for crisp topographic images.
A 300khz resonant frequency and 26N/m spring constant make this an industry standard probe for regular tapping mode-based topography.

Suitable for a wide range of polymeric, metallic, semiconductor, ceramic and similar samples.

Tip Specification
OTESPA-R4 Tip Image
Tip Height (h): 9 - 19 µm
Front Angle (FA): 0 ± 1º
Back Angle (BA): 35 ±1º
Side Angle (SA): 18 ±1º
Cantilever Specification
OTESPA-R4 Cantilever Image
Material: 0.01 - 0.02 Ωcm Silicon
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.7µm
Cantilever Thickness (RNG): 3.2 - 4.2µm
Back Side Coating: Reflective Aluminum
Top Layer Back: 100 nm of Al