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RFESPG-75
Geometry
RectangularTip Radius (nm)
Nom: 8
Max: 12.5
Frequency (KHz)
Nom: 75
Min: 50
Max: 100
Length (µm)
Nom: 225
Min: 215
Max: 235
Spring Const (N/m)
Nom: 3.0
Min: 1.5
Max: 6.0
Width (µm)
Nom: 35
Min: 33
Max: 37
Price: $404.25 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
Overview
This is the gold coated version of RFESP-75.
A pack of 10 High quality etched silicon probes for soft TappingMode™ imaging and force modulation in air. Unmounted for use on standard AFM's. Premium High-Resolution Force Modulation silicon probes on improved V2 cantilever with gold-coated tip. This probe uses a rotated tip to provide a more symmetric representation of features over 200nm.
With precisely controlled cantilever geometry to enable repeatable scanning parameters, an extra sharp tip radius to reduce the AFM's minimum detectable feature size, and a taller tip to minimize squeeze film damping, the MPP is the industry standard for high-performance and high-quality imaging on a wide variety of sample types.
The new design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics
Tip Specification
Tip Height (h): 10 - 15 µm
Front Angle (FA): 17.5 ± 2.5º
Back Angle (BA): 25 ± 2.5º
Side Angle (SA): 20 ± 2.5º
Cantilever Specification
Material: Single Crystal Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.8µm
Cantilever Thickness (RNG): 2.05 - 3.55µm
Back Side Coating: Ti/Au