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Tip Radius (nm)
Nom: 10
Frequency (KHz)
Nom: 750
Min: 500
Max: 1000
Length (µm)
Nom: 125
Min: 115
Max: 135
Spring Const (N/m)
Nom: 350
Min: 100
Max: 650
Width (µm)
Nom: 30
Min: 25
Max: 35
Price: $1,500.00 (USD)
Sold in packs of 5
Questions? Free, Online Consulting
Nanomechanics Probe, 350 N/m, 750kHz, 10nm ROC, 5-Pack. Uncalibrated.
These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a broad cone angle the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations into materials such as fused silica and can image the indents at high resolution in-situ using the same probe. Each cantilever comes individually characterized with both spring constant and tip radius accurately measured, to enable fully quantitative nanomechanical measurements. Each probe comes with a high-resolution SEM image showing the precise tip shape to enable fully quantitative measurements. A gold reflex coating deposited on the detector side of the cantilever to enhance the reflectance of the laser beam. 
Nanomechanical modes: Tomography, nanoscratching, and nanoindentation, and their combination with PeakForce QNM, FASTForce Volume, or contact resonance.
All Adama probes are now included in the Sader Method - Global Calibration Initiative.
Tip Specification
Tip Height (h): 12.5 +/- 2.5 µm
Front Angle (FA): 25+/-5º
Back Angle (BA): 15+/-5º
Side Angle (SA): 22.5+/-5º
Cantilever Specification
Material: Diamond nmech probe, 350N/M, UNCALIBRATED, 5PK
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 4µm
Cantilever Thickness (RNG): 3.5-4.5µm
Back Side Coating: Reflective Au