Skip to Main Content


Tip Radius (nm)
Nom: 10
Max: 15
Frequency (KHz)
Nom: 750
Min: 500
Max: 1000
Length (µm)
Nom: 125
Min: 115
Max: 135
Spring Const (N/m)
Nom: 350
Min: 100
Max: 600
Width (µm)
Nom: 30
Min: 25
Max: 35
Price: $2,000.00 (USD)
Sold in packs of 5
Questions? Free, Online Consulting

Nanomechanics Probe, 350 N/m, 750kHz, 10nm ROC, 5-Pack. Spring constant individually calibrated.


These tips are specifically designed for high mechanical loads and scratch testing applications. By using wear-resistant diamond and a broad cone angle, the contact size is well characterized and stays constant during repeated mechanical measurements. These probes have demonstrated highly repeatable deep (~100nm) indentations into materials such as fused silica and can image the indents at high resolution in-situ using the same probe. Each cantilever comes individually characterized with both spring constant and tip radius accurately measured, to enable fully quantitative nanomechanical measurements. Each probe comes with a high-resolution SEM image showing the precise tip shape to enable fully quantitative measurements. A gold reflex coating is deposited on the detector side of the cantilever to enhance the reflectance of the laser beam.

Nanomechanical modes: Tomography, nanoscratching, and nanoindentation, and their combination with PeakForce QNM, FASTForce Volume, or contact resonance.


Tip Specification
Tip Height (h): 12.5 +/- 2.5 µm
Front Angle (FA): 25 +/- 5º
Back Angle (BA): 15 +/- 5º
Side Angle (SA): 22.5 +/- 5º
Cantilever Specification
Material: Diamond
Cantilever Thickness (Nom): 4µm