Skip to Main Content

HAR1-200A-10

HAR1-200A-10
Geometry
Rectangular
Tip Radius (nm)
Nom: 10
Max: 15
Frequency (KHz)
Nom: 320
Min: 230
Max: 410
Length (µm)
Nom: 125
Min: 110
Max: 140
Spring Const (N/m)
Nom: 42
Min: 10
Max: 80
Width (µm)
Nom: 40
Min: 30
Max: 50
Price: $1,100.00 (USD)
Sold in packs of 10
Order a free HAR1-200A-10 sample
Questions? Free, Online Consulting
+1 (800) 715-8440
Overview
Tilt-Compensated High Aspect Ratio (5:1) Focused Ion Beam (FIB) probes for high resolution TappingMode imaging on samples with tall/deep geometries.

Specifications:
- 42 N/m, 320 kHz, 10 nm radius, Al reflex coating.
- 10 probes per pack.
- Compatible with most commercially available AFMs.

Tip Specification
High aspect ratio probe based upon Bruker technology and made from our TESP. Aspect ratio of 5:1 at 1um from tip apex.
Tip Height (h): 10 - 15 µm
Front Angle (FA): 5 ± 0.5º
Back Angle (BA): 5 ± 0.5º
Side Angle (SA): 5 ± 0.5º
Cantilever Specification
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 4µm
Cantilever Thickness (RNG): 3.5 - 4.5µm
Back Side Coating: Reflective Aluminum
Loading...
<