Skip to Main Content
Close
0
Probes → VITA-DM-NANOTA-300

VITA-DM-NANOTA-300

VITA-DM-NANOTA-300
Geometry
Thermal
Frequency (KHz)
Nom: 0
Min: 15
Max: 30
Length (µm)
Nom: 300
Min:
Max:
Spring Const (N/m)
Nom: 0
Min: 0.1
Max: 0.5
4 Total Related Products
VITA-TS-STHM

SThM test sample comprising of carbon fibers embedded in epoxy and cross sectioned. The fiber and epoxy regions give contrast variation over a variety of scanning modes.

Topographic view:    Thermal view:

   

 


View...
VITA-CS-NANOTA
VITA nTA Calibration Sample Set consisting of three polymer samples with known transition temperatures. These sample allow for temperature calibration of each nTA probe.

The melt transitions for each of them are:
a) Think film samples of polycaprolactone (PCL, Tm = 55º C)
b) High density polyethylene (HDPE, Tm = 116º C)
c) Polyethylene terephthalate (PET, Tm = 235º C)
View...
VITA-DM-NANOTA-200
NanoTA probes for Dimension SPMs, 200 micron length.

Note:
Specifically designed for use with VITA module.  Uses other than with VITA module void probe warranty.
View...
VITA-DM-GLA-1
SThM probes for Dimension SPMs, 150 micron length.

Note:
Small adjustments of camera position may be needed for probe viewing. Specifically designed for use with VITA module.  Uses other than with VITA module void probe warranty. Highly static sensitive.  Do not measure resistance with conventional resistance meters. Not compatible with previous generation SThM application modules.View...
Questions? Free, Online Consulting
+1 (800) 715-8440
Overview
NanoTA probes for Dimension SPMs, 300 micron length.

Note:
Specifically designed for use with VITA module.  Uses other than with VITA module void probe warranty.
Tip Specification
VITA-DM-NANOTA-300 Tip Image
Probes are micro-machined silicon probes; similar in geometry to standard Silicon AFM probes but incorporate a resistive heater at the end of the cantilever. These probes have the capability to image the sample surface significantly better than most thermal probes. Probes can be heated repeatedly and reliably to higher temperatures (400°C) than other thermal probes made of thin metal films. Note: Specifically designed for use with VITA module. Uses other than with VITA module void probe warranty.
Tip Height (h): 3-6 µm
Cantilever Specification
VITA-DM-NANOTA-300 Cantilever Image
Material: Silicon
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2µm
© 2026 Bruker AFM Probes, All Rights Reserved.
Loading...