Bruker AFM Probes - MDNISP-HS

Geometry

Rectangular

Tip Radius (nm)

Nom: 40

Max: 50

Frequency (KHz)

Nom: 70

Min: 50

Max: 90

Length (µm)

Nom: 350

Min: 300

Max: 500

Spring Const (N/m)

Nom: 450

Min: 300

Max: 600

Width (µm)

Nom: 100

Min: 80

Max: 120

Price: $3,900.00 (USD)

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Probe Selection Guide

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Overview

Hand-crafted natural diamond Nanoindenting tip.
- Mounted for the MultiMode AFM.
- High spring constant range.
- Quantity=1
- Specific spring constant range can be requested as a special order for added cost. Contact your local Bruker representative for more information.

Tip Specification

The MDNISP-HS is a MultiMode mounted, hand crafted ultra high force cantilever for nanoindenting/nanoscratching applications. The tip is designed to be ultra high strength and is fabricated by precision grinding of a solid diamond. These tips are not for use in general imaging. The diamond tip apex is the corner of a cube so that three right angle planes form the apex “A”. To provide more symmetric dents, the diamond is mounted with the vertical axis of the tip approximately normal to the sample when mounted on the microscope. The nanoindenting probe is designed for use in air and is not recommended for liquid operation due to contamination & solvent incompatibility issues.

Tip Height (h): 50 µm

Front Angle (FA): 30 ± 2º

Back Angle (BA): 30 ± 2º

Side Angle (SA): 30 ± 2º

Cantilever Specification

Each cantilever individually qualified and is supplied with a calibration certificate. These probes can be repaired - contact Bruker AFM Probes.

Material: Stainless Steel

Geometry: Rectangular

Cantilevers Number: 1

Cantilever Thickness (Nom): 13µm

Cantilever Thickness (RNG): 11-15µm

MDNISP-HS

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