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Multi MPP - Rotated

The MPP Multi cantilevers are designed for high resolution force modulation imaging and specialty applications.  These probes, identical in tip sharpness and cantilever geometry to the standard Multi MPP probes, have a 180° rotated tip that provides a more symmetric representation of features over 200nm than the standard tip.  The rotated versions of Veeco's flagship MPP probes are an excellent choice for high sensitivity silicon probe imaging.