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Contact MPP - Rotated

The MPP Contact cantilevers are designed for high resolution contact mode imaging.  These probes, identical in tip sharpness and cantilever geometry to the standard Contact MPP probes, have a 180° rotated tip that provides a more symmetric representation of features over 200nm than the standard tip.  The rotated versions of Veeco's flagship MPP probes are an excellent choice for high sensitivity silicon probe imaging.