Skip to Main Content
Close
Account
Your Account
Login
Orders
0
Products
Probes
View All Probes
AFM-IR
Conductive AFM (CAFM)
Contact Mode
Contact Resonance
Critical Dimension (CD) AFM
Current In-Plane Tunneling (CIPT)
Deep Trench (DT)
Electrical Spectroscopy
Electrostatic Force Microscopy (EFM)
Fast Scan
FASTForce Volume
Force Modulation
Force Spectroscopy
HarmoniX
Lateral Force Microscopy (LFM)
Magnetic Force Microscopy (MFM)
NanoIndentation
Nanoscale Thermal Analysis
PeakForce Deep Trench
PeakForce QNM
PeakForce QNM High-Accuracy
PeakForce Tapping
PeakForce TUNA
Piezoresponse/ Piezoforce Microscopy (PFM)
ScanAsyst
Scanning Capacitance Mode (SCM)
Scanning Electrochemical Potential Microscopy (SECPM)
Scanning Microwave Impedance Microscopy (sMIM)
Scanning Spreading Resistance Mode (SSRM)
Scanning Tunneling Microscopy (STM)
Surface Potential Microscopy (SPoM)
TappingMode/ Non-Contact
Tip Enhanced Raman Spectroscopy (TERS)
Torsional Resonance (TR)
Tunneling AFM (TUNA)
Accessories
By AFM Accessory
BioScope Catalyst Accessories
BioScope Resolve Accessories
Bioscope® Accessories
Caliber™ Accessories
Dimension Accessories
EnviroScope™ Accessories
For All AFMs Accessories
Innova™ Accessories
MultiMode® Accessories
Accessory Type
Alignment Stands
Calibration References
Calibration Standards
Condensation Windows
Evaporation Covers
Fluid Cell Kits
Fluid Cells
MFM Tool Kits
Mounting Kits
O-Rings
Probe Holders
Probe Storage Kits
Replacement Springs
Sample Holders
Splash Guards
Starter Kits
Test Samples
Probe Types
Value Line Probes
Popular Probes
New Probes
Unique Probes
High-Performance Probes
AAFM Probes
News
Support
AFM Probe FAQs
Bruker site
Applications Selector Guide
About Bruker AFM Probes
Contact
+1 (800) 715-8440
+1 (800) 715-8440
Probes
→
Modes and Applications
→
Specialty Probes
→ NSOM
NSOM
© 2024 Bruker AFM Probes, All Rights Reserved.
Keep Shopping
Shopping Cart:
0
Items
Your shopping cart is currently empty.
Loading...