Skip to Main Content
Close
0
Probes → SCM-PTSI
Popular
Unique
High Performance
New

SCM-PTSI

SCM-PTSI
Geometry
Rectangular
Tip Radius (nm)
Nom: 15
Max: 20
Frequency (KHz)
Nom: 75
Min: 50
Max: 100
Length (µm)
Nom: 225
Min: 200
Max: 250
Spring Const (N/m)
Nom: 2.8
Min: 1
Max: 5
Width (µm)
Nom: 28
Min: 23
Max: 33
2 Total Related Products
DDESP-V2
Bruker DDESP-V2 Electrical Probes providing consistent performance and high sensitivity.

Bruker's new conductive diamond coated probes provide high performance Scanning Spreading Resistance Microscopy (SSRM) and Piezoresponse Force Microscopy (PFM) to characterize semiconductor devices, MEMS, and biosensors providing prolonged tip lifetime in combination with conductivity.

The DDESP-V2 probe provides:

• High electrical performance due to its consistent tip shape

• Sensitive nanoelectrical measurements with highly conductive coating
• High quality probe manufactured by Bruker AFM Probes

Other applications of the DDESP-V2 probe include: Scanning Capacitance Microscopy (SCM), conductivity measurements (C-AFM and PeakForce TUNA), and other electrical characterization applications. 

Looking for higher lateral resolution electrical measurements?  Try our SCM-PTSI probes.

View...
DDESP-FM-V2
Bruker DDESP-FM-V2 Electrical Probes providing consistent performance and high sensitivity.

Bruker's new conductive diamond coated probes provide high performance Scanning Spreading Resistance Microscopy (SSRM) and Piezoresponse Force Microscopy (PFM) to characterize semiconductor devices,  MEMS, and biosensors providing prolonged tip lifetime in combination with conductivity.

The DDESP-FM-V2 probe provides:

• High electrical performance due to its consistent tip shape
• Sensitive nanoelectrical measurements with highly conductive coating
• High quality probe manufactured by Bruker AFM Probes

Other applications of the DDESP-FM-V2 probe include: Scanning Capacitance Microscopy (SCM), conductivity measurements (C-AFM and PeakForce TUNA), and other electrical characterization applications.

View...
Order a free SCM-PTSI sample
Price: $1,680.00 (USD)
Sold in packs of 10
+
-
Shipping Info
Probe Selection Guide
Email Us
Questions? Free, Online Consulting
+1 (800) 715-8440
Overview
For the highest resolution nanoelectrical measurements with outstanding wear resistance.

Bruker's platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements, conductivity measurements (Conductive AFM (C-AFM) and PeakForce TUNA), Electrical Force Microscopy (EFM), and other characterization applications. on the most advanced semiconductor features, providing the highest resolution imaging and long tip lifetime due to its outstanding wear resistant properties. 

The Bruker SCM-PtSi probe provides:

• High resolution electrical imaging with an ultra-sharp conductive tip
• Consistent performance with high measurement lifetime
• Highly sensitive nanoelectrical measurements

Bruker Atomic Force Microscopy group also provides many other nano-electrical probes and modes for AFM based electrical measurements including our unique PeakForce KPFM & PeakForce TUNA modes.


Tip Specification
SCM-PTSI Tip Image
Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 17.5 ± 2.5º
Side Angle (SA): 20 ± 2.5º
Cantilever Specification
SCM-PTSI Cantilever Image
Material: 0.01 - 0.025 Ocm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.75µm
Cantilever Thickness (RNG): 2.0 - 3.5µm
Back Side Coating: Reflective Al
© 2024 Bruker AFM Probes, All Rights Reserved.
Loading...