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Featured Products
PFQNE-AL
Bruker's new PeakForce KPFM probes, 10-pack. 300 kHz, 1.5 N/m. A 10-pack of sharp nitride l
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Bioscope®
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2
1550-00
Cantilever & wafer tool kit for all Veeco SPMs: 1 scribe, 1 wafer tweezers, 3 regular tweezers. Thi...
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EVAPCVR
These 60mm, silicone petri dish covers protect the scanner and precent evaporation of fluid during ...
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FSUB-11
Amine functionalized silicon substrate for immobilizing biological molecules for AFM imaging.
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HOPG
HOPG is often used as a standard testing sample for Scanning Tunneling Microscopy (STM). It is a hi...
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MICA
Mica sample disks are useful as a sample substrate (especially for biological samples) and as an at...
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PG-STM
Calibration Artifact: 100nm Depth, 1µm Pitch, Pt Coated. This sample is identical to sample PG but ...
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PS-LDPE-12M
HarmoniX Training Sample for MultiMode and Dimension SPMs· A two-component polymer sample mounted o...
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RDS-F
Replacement Windows XP Datastation for NanoScope SPMs. Compatible with NanoScope AFMs, LFMs, MMAFM...
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RS
Titanium Roughness Sample. This is used with the NanoScope tip-evaluation software. Tip-evaluation ...
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SD-101
SPM sample mounting disks, steel, 12mm diameter. Qty 50.
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SD-104
SPM sample mounting disks, 6mm diameter. Qty 50.
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STKYDOT
A full package of adhesive pads for mounting samples on to steel mounting disks. These are 36 adhes...
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STOR1
Tip storage kit provides convenient storage for individual tips from whole wafers. Includes one she...
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STOR2
Tip storage kit with gel for silicon nitride cantilevers. This tip storage kit provides convenient ...
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STR10-1800P
Calibration artifact, 180nm step height, 10µm pitch. This VLSI Surface Topography Reference Dies ha...
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STR10-180P
Calibration artifact: 18nm step height, 10µm pitch. This VLSI Surface Topography Reference Dies hav...
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STR10-440P
Calibration artifact: 44nm step height, 10µm pitch. This VLSI Surface Topography Reference Dies hav...
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STR3-1000P
Calibration artifact: 100nm step height, 3µm pitch. This VLSI Surface Topography Reference Dies hav...
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STR3-1800P
Calibration artifact: 180nm step height, 3µm pitch. This VLSI Surface Topography Reference Dies hav...
Details
STR3-180P
Calibration artifact: 18nm step height, 3µm pitch. This VLSI Surface Topography Reference Dies have...
Details
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