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CONTV-PT
Geometry
RectangularTip Radius (nm)
Nom: 25
Frequency (KHz)
Nom: 13
Min: 10
Max: 16
Length (µm)
Nom: 450
Min: 405
Max: 495
Spring Const (N/m)
Nom: 0.2
Min: 0.1
Max: 0.4
Width (µm)
Nom: 50
Min: 45
Max: 55
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Price: $246.75 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
Overview
A pack of Conductive Silicon Probes.
Bruker's Value Line Probe for Electrical Characterization using Contact Mode in air.
Specifications:
- Tip radius of 25 nm nominal.
- Platinum-Iridium coated, electrically conductive tip that is ideal for various electrical characterization applications.
-The Pt-Ir coating on the front side of the cantilever provides a metallic electrical path from the cantilever die to the apex of the tip.
- The coating on the back side of the cantilever enhances laser reflectivity.
- Unmounted for all AFMs.
Bruker's Value Line Probe for Electrical Characterization using Contact Mode in air.
Specifications:
- Tip radius of 25 nm nominal.
- Platinum-Iridium coated, electrically conductive tip that is ideal for various electrical characterization applications.
-The Pt-Ir coating on the front side of the cantilever provides a metallic electrical path from the cantilever die to the apex of the tip.
- The coating on the back side of the cantilever enhances laser reflectivity.
- Unmounted for all AFMs.
Tip Specification
Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5ºº
Back Angle (BA): 15 ± 2.5ºº
Side Angle (SA): 22.5 ± 2.5ºº
Cantilever Specification
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2µm
Cantilever Thickness (RNG): 1.5 - 2.5 µm
Back Side Coating: Reflective PtIr