Sample

Application

Mode

AFM

Resonant Frequency:

kHz

Spring Constant:

N/m

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PFTUNA

PFTUNA probes combine the low spring constant and high sensitivity of a nitride cantilever with a sh

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DNP-S

Product Description:

A wafer of Silicon Nitride Probes
Premium Contact Mode or Fluid TappingMode imaging and force measurement probes, sharpened for higher-resolution. Unmounted for BioScope / Dimension AFMs.
Quantity=380
*Due to the inherent danger of mishandling or contamination during extraction of probes by non-Bruker personnel, we do not guarantee performance of wafers once opened at the consumers site. Instead, we highly recommend buying in larger quantities of 10-packs to guarantee performance, taking advantage of bulk discount pricing.

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Model	Mount	Pack Size	Price	Pack Quantity
DNP-S	Unmounted	375	$5,035.00 (USD)

Shape	Resonant Freq. kHz			Spring Const. N/m			Length µm			Width µm
Shape	Nom.	Min.	Max.	Nom.	Min.	Max.	Nom.	Min.	Max.	Nom.	Min.	Max.
A Triangular	65	50	80	0.35	0.175	0.7	120	125	115	25	20	30
B Triangular	23	16	28	0.12	0.06	0.24	205	200	210	40	25	45
C Triangular	56	40	75	0.24	0.12	0.48	120	115	125	20	15	25
D Triangular	18	12	24	0.06	0.03	0.12	205	200	210	25	20	30

Tip Specification

Sharpened DNP tip.

Tip Schematic

Geometry:	Rotated (Symmetric)
Tip Height (h):	2.5 - 8.0µm
Front Angle (FA):	15 ± 2.5º
Back Angle (BA):	25 ± 2.5º
Side Angle (SA):	17.5 ± 2.5º
Tip Radius (Nom):	10nm
Tip Radius (Max):	40nm
Tip SetBack (TSB)(Nom):	4µm
Tip Set Back (TSB)(RNG):	0 - 7µm

Cantilever Specification

Cantilever Orientation diagram can be found here.

DNP probes have less than 2deg of cantilever bend. The nominal stress specification for NP probes is less than 4deg of cantilever bend. For Bruker's Dimension SPMs, DNP is recommended.

Cantilever schematic

Material:	Silicon Nitride
Geometry:	Triangular
Cantilevers Number:	4
Cantilever Thickness (Nom):	0.6µm
Cantilever Thickness (RNG):	0.55 - 0.65µm
Back Side Coating:	Reflective Gold
Top Layer Back:	45 ± 5 nm of Ti/Au