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VTESPA-70-W

VTESPA-70-W
Geometry
Rectangular
Tip Radius (nm)
Nom: 5
Max: 8
Frequency (KHz)
Nom: 70
Min: 50
Max: 90
Length (µm)
Nom: 225
Min: 215
Max: 235
Spring Const (N/m)
Nom: 2.9
Min: 0.8
Max: 3.7
Width (µm)
Nom: 40
Min: 38
Max: 42
Price: $5,814.00 (USD)
Questions? Free, Online Consulting
+1 (800) 715-8440
Overview
Bruker's New VTESPA-70 combines the advantage of a visible apex tip for feature targeting with the best measurement consistency and highest performance for TappingMode imaging.  It covers a wide range of TappingMode imaging applications and is ideal for roughness measurements, imaging IC devices, thin films, and crystal surfaces.
Tip Specification
Tip Height (h): 12.5 µm
Front Angle (FA): 0 ± 2º
Back Angle (BA): 54 ± 2º
Side Angle (SA): 30 ± 2º
Cantilever Specification
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.4µm
Cantilever Thickness (RNG): 1.7 - 3.1µm
Back Side Coating: Reflective Al
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