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Tip Radius (nm)
Nom: 5
Max: 8
Frequency (KHz)
Nom: 70
Min: 50
Max: 90
Length (µm)
Nom: 225
Min: 215
Max: 235
Spring Const (N/m)
Nom: 2.9
Min: 0.8
Max: 3.7
Width (µm)
Nom: 40
Min: 38
Max: 42
Price: $374.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting

Bruker's New VTESPA-70 is the highest resolution visible apex tip on the market.

VTESPA-70 combines the advantage of a visible apex tip for feature targeting with the best measurement consistency and highest performance for TappingMode imaging.It covers a wide range of TappingMode imaging applications and is ideal for roughness measurements, imaging IC devices, thin films, and crystalsurfaces. VTESPA-70 uses a low 2.9N/m spring constant. For the same tip with a 40N/m, 300kHz cantilever see VTESPA-300.


Key features of the probe include:

1) Visible apex tip enables AFM imaging exactly at the location targeting through the AFM optics.

2) Attains the highest consistency in AFM measurements due to industry bestprobe-to-probe consistency in tip radius, tip height, spring constant, and tapping frequency.

3) Designed and optimized by Bruker, the inventor of TappingMode, to achieve the highest performance TappingMode imaging.

4) Produces accurate images of rugged features, enabled by the narrow tip angleand forward pointing tip design that effectively compensates for the forwardtilt of the AFM probe holder (typically 5-20 degrees).

Visible Apex Probe with highest performance and consistency.
- 2.9 N/m, 70kHz
- AluminumReflex Coating
- 10 pack
- Also available as wafer model VTESPA-70-W
Tip Specification
Tip Height (h): 12.5 µm
Front Angle (FA): 0 ± 2º
Back Angle (BA): 35 ± 2º
Side Angle (SA): 30 ± 2º
Cantilever Specification
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.4µm
Cantilever Thickness (RNG): 1.7 - 3.1µm
Back Side Coating: Reflective Al