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Probes → Probes Application Selector Guide → Silicon → Visible Apex → VTESPA-300-W

VTESPA-300-W

VTESPA-300
Geometry
Rectangular
Tip Radius (nm)
Nom: 5
Max: 8
Frequency (KHz)
Nom: 300
Min: 225
Max: 375
Length (µm)
Nom: 150
Min: 140
Max: 160
Spring Const (N/m)
Nom: 42
Min: 25
Max: 65
Width (µm)
Nom: 40
Min: 38
Max: 42
4 Total Related Products
A pack of Silicon Probes.
Quantity=Wafer

Bruker's Value Line etched silicon probes for imaging in TappingMode™ and non-contact mode in air, with reflective coating.  This probe is also available without Aluminum reflex coating as model NCHV-W.

Specifications:
- 40N/m, 320kHz, Al Reflective Coating.
- Unmounted for use on any AFM.
NCHV-AW
A pack of Silicon Probes.
Quantity=Wafer

Bruker's Value Line etched silicon probes for imaging in TappingMode™ and non-contact mode in air, with reflective coating.  This probe is also available without Aluminum reflex coating as model NCHV-W.

Specifications:
- 40N/m, 320kHz, Al Reflective Coating.
- Unmounted for use on any AFM.View...
A wafer of high quality, etched silicon probes for TappingMode™ and other non-contact modes.  Unmounted for use on standard AFM's.

Bruker AFM Probes has introduced an improved version of its popular,TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premiumetched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.  

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model TESPW-V2.  

The current model TESPAW is available for ordering through early 2014 at which point, it will become obsolete.
TESPAW-V2
A wafer of high quality, etched silicon probes for TappingMode™ and other non-contact modes.  Unmounted for use on standard AFM's.

Bruker AFM Probes has introduced an improved version of its popular,TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premiumetched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.  

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model TESPW-V2.  

The current model TESPAW is available for ordering through early 2014 at which point, it will become obsolete.View...
A wafer of High quality etched silicon probes for TappingMode™ and other non-contact modes.  Unmounted for use on standard AFM's.

Bruker's flagship MPP probes are the preferred choice for high-sensitivity silicon probe imaging in TappingMode or non-contact mode in air.  Every aspect of the MPP design has been optimized to provide the most accurate profiling of microscopic features.  With precisely controlled cantilever geometry to enable repeatable scanning parameters, an extra sharp tip radius to reduce the AFM's minimum detectable feature size, and a taller tip to minimize squeeze film damping, the MPP is the industry standard for high-performance and high-quality imaging on a wide variety of sample types. 

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model RTESPW-300.
RTESPAW-300
A wafer of High quality etched silicon probes for TappingMode™ and other non-contact modes.  Unmounted for use on standard AFM's.

Bruker's flagship MPP probes are the preferred choice for high-sensitivity silicon probe imaging in TappingMode or non-contact mode in air.  Every aspect of the MPP design has been optimized to provide the most accurate profiling of microscopic features.  With precisely controlled cantilever geometry to enable repeatable scanning parameters, an extra sharp tip radius to reduce the AFM's minimum detectable feature size, and a taller tip to minimize squeeze film damping, the MPP is the industry standard for high-performance and high-quality imaging on a wide variety of sample types. 

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model RTESPW-300.
View...
Visible Apex Probe with highest performance and consistency.
- 42 N/m, 300 kHz
- Aluminum Reflex Coating
- 10 pack
- Also available as wafer model VTESPA-300-W

Bruker's New VTESPA-300 is the highest resolution visible apex tip on the market.

VTESPA-300 combines the advantage of a visible apex tip for feature targeting with the best measurement consistency and highest performance for TappingMode imaging.  It covers a wide range of TappingMode imaging applications and is ideal for roughness measurements, imaging IC devices, thin films, and crystal surfaces.  Key features of the probe include:

1) Visible apex tip enables AFM imaging exactly at the location targeting through the AFM optics.

2) Attains the highest consistency in AFM measurements due to industry best probe-to-probe consistency in tip radius, tip height, spring constant, and tapping frequency.

3) Designed and optimized by Bruker, the inventor of TappingMode, to achieve the highest performance TappingMode imaging.

4) Produces accurate images of rugged features, enabled by the narrow tip angle and forward pointing tip design that effectively compensates for the forward tilt of the AFM probe holder (typically 5-20 degrees).
VTESPA-300
Visible Apex Probe with highest performance and consistency.
- 42 N/m, 300 kHz
- Aluminum Reflex Coating
- 10 pack
- Also available as wafer model VTESPA-300-W

Bruker's New VTESPA-300 is the highest resolution visible apex tip on the market.

VTESPA-300 combines the advantage of a visible apex tip for feature targeting with the best measurement consistency and highest performance for TappingMode imaging.  It covers a wide range of TappingMode imaging applications and is ideal for roughness measurements, imaging IC devices, thin films, and crystal surfaces.  Key features of the probe include:

1) Visible apex tip enables AFM imaging exactly at the location targeting through the AFM optics.

2) Attains the highest consistency in AFM measurements due to industry best probe-to-probe consistency in tip radius, tip height, spring constant, and tapping frequency.

3) Designed and optimized by Bruker, the inventor of TappingMode, to achieve the highest performance TappingMode imaging.

4) Produces accurate images of rugged features, enabled by the narrow tip angle and forward pointing tip design that effectively compensates for the forward tilt of the AFM probe holder (typically 5-20 degrees).
View...
Price: $5,814.00 (USD)
Sold in packs of 375
+
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Overview
Visible Apex Probe with highest performance and consistency.
- 40 N/m, 300 kHz
- Aluminum Reflex Coating
- Wafer (375 Probes)
- Also available as 10-Pack model VTESPA-300

Bruker's New VTESPA-300 is the highest resolution visible apex tip on the market. It combines the advantage of a visible apex tip for feature targeting with the best measurement consistency and highest performance for TappingMode imaging.  It covers a wide range of TappingMode imaging applications and is ideal for roughness measurements, imaging IC devices, thin films, and crystal surfaces.  Key features of the probe include:

1) Visible apex tip enables AFM imaging exactly at the location targeting through the AFM optics.

2) Attains the highest consistency in AFM measurements due to industry best probe-to-probe consistency in tip radius, tip height, spring constant, and tapping frequency.

3) Designed and optimized by Bruker, the inventor of TappingMode, to achieve the highest performance TappingMode imaging.

4) Produces accurate images of rugged features, enabled by the narrow tip angle and forward pointing tip design that effectively compensates for the forward tilt of the AFM probe holder (typically 5-20 degrees).
Tip Specification
VTESPA-300-W Tip Image
Tip Height (h): 9.0 - 12 µm
Front Angle (FA): 0 ± 2º
Back Angle (BA): 54 ± 2º
Side Angle (SA): 30 ± 2º
Cantilever Specification
VTESPA-300-W Cantilever Image
Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 4.4µm
Cantilever Thickness (RNG): 3.9 - 4.9µm
Back Side Coating: Reflective Al
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