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VTESPA-300
Geometry
RectangularTip Radius (nm)
Nom: 5
Max: 8
Frequency (KHz)
Nom: 300
Min: 225
Max: 375
Length (µm)
Nom: 150
Min: 140
Max: 160
Spring Const (N/m)
Nom: 42
Min: 25
Max: 65
Width (µm)
Nom: 40
Min: 38
Max: 42
Order a free VTESPA-300 sample
Price: $374.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
Overview
Visible Apex Probe with highest performance and consistency.
- 42 N/m, 300 kHz
- Aluminum Reflex Coating
- 10 pack
- Also available as wafer model VTESPA-300-W
Bruker's New VTESPA-300 is the highest resolution visible apex tip on the market.
- 42 N/m, 300 kHz
- Aluminum Reflex Coating
- 10 pack
- Also available as wafer model VTESPA-300-W
Bruker's New VTESPA-300 is the highest resolution visible apex tip on the market.
VTESPA-300 combines the advantage of a visible apex tip for feature targeting with the best measurement consistency and highest performance for TappingMode imaging. It covers a wide range of TappingMode imaging applications and is ideal for roughness measurements, imaging IC devices, thin films, and crystal surfaces. Key features of the probe include:
1) Visible apex tip enables AFM imaging exactly at the location targeting through the AFM optics.
2) Attains the highest consistency in AFM measurements due to industry best probe-to-probe consistency in tip radius, tip height, spring constant, and tapping frequency.
3) Designed and optimized by Bruker, the inventor of TappingMode, to achieve the highest performance TappingMode imaging.
4) Produces accurate images of rugged features, enabled by the narrow tip angle and forward pointing tip design that effectively compensates for the forward tilt of the AFM probe holder (typically 5-20 degrees).
1) Visible apex tip enables AFM imaging exactly at the location targeting through the AFM optics.
2) Attains the highest consistency in AFM measurements due to industry best probe-to-probe consistency in tip radius, tip height, spring constant, and tapping frequency.
3) Designed and optimized by Bruker, the inventor of TappingMode, to achieve the highest performance TappingMode imaging.
4) Produces accurate images of rugged features, enabled by the narrow tip angle and forward pointing tip design that effectively compensates for the forward tilt of the AFM probe holder (typically 5-20 degrees).
Tip Specification
Tip Height (h): 9.0 - 12 µm
Front Angle (FA): 0 ± 2º
Back Angle (BA): 35 ± 2º
Side Angle (SA): 30 ± 2º
Cantilever Specification
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 4.4µm
Cantilever Thickness (RNG): 3.9 - 4.9µm
Back Side Coating: Reflective Al