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FESPW-V2
Geometry
RectangularTip Radius (nm)
Nom: 8
Max: 12
Frequency (KHz)
Nom: 75
Min: 50
Max: 100
Length (µm)
Nom: 225
Min: 215
Max: 235
Spring Const (N/m)
Nom: 2.8
Min: 1
Max: 5
Width (µm)
Nom: 35
Min: 33
Max: 37
Price: $5,985.00 (USD)
Sold in packs of 375
Questions? Free, Online Consulting
+1 (800) 715-8440
Overview
A wafer of High quality etched silicon probes for soft TappingMode™ imaging and force modulation in air. Unmounted for use on standard AFM's.
Bruker AFM Probes has introduced an improved version of its popular,FESP/FESPA AFM probes. Bruker’s new line of FESP high quality premiumetched silicon probes set the industry standard for soft TappingMode imaging and force modulation in air.
The new design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model FESPAW-V2.
Bruker AFM Probes has introduced an improved version of its popular,FESP/FESPA AFM probes. Bruker’s new line of FESP high quality premiumetched silicon probes set the industry standard for soft TappingMode imaging and force modulation in air.
The new design provides:
• Tighter dimensional specifications for improved probe to probe consistency
• Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
• Improved probe quality & aesthetics
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model FESPAW-V2.
Tip Specification
Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5º
Side Angle (SA): 22.5 ± 2.5º
Cantilever Specification
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.75µm
Cantilever Thickness (RNG): 2.0 - 3.5µm