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OLTESPA-R3

OLTESPA-R3
Geometry
Rectangular
Tip Radius (nm)
Nom: 7
Max: 10
Frequency (KHz)
Nom: 70
Min: 50
Max: 90
Length (µm)
Nom: 240
Min: 225
Max: 255
Spring Const (N/m)
Nom: 2
Min: 0.6
Max: 3.5
Width (µm)
Nom: 40
Min: 38
Max: 42
3 Total Related Products
NCHV-A
A pack of Silicon Probes.
Quantity=10

Bruker's Value Line etched silicon probes for imaging in TappingMode™ and non-contact mode in air, with reflective coating.  This probe is also available without Aluminum reflex coating as model NCHV.

Specifications:
- 40N/m, 320kHz, Al Reflective Coating.
- Unmounted for use on any AFM.View...
FMV-A
A pack of Silicon Probes.
Quantity=10

Bruker's Value Line of soft TappingMode™ and Force Modulation probes, with reflective coating.  This probe is also available without Aluminum reflex coating as model FMV.

Specifications:
- 2.8N/m, 75kHz, Al Reflective Coating.
- Unmounted for use on any AFM.View...
TESPA-V2
A pack of 10 High quality etched silicon probes for TappingMode™ and other non-contact modes.  Unmounted for use on standard AFM's. 

Bruker AFM Probes has introduced an improved version of its popular,TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premium etched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.  

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model TESP-V2.  
View...
Order a free OLTESPA-R3 sample
Price: $446.25 (USD)
Sold in packs of 10
+
-
Shipping Info
Probe Selection Guide
Email Us
Questions? Free, Online Consulting
+1 (800) 715-8440
Overview

Now through December 31, 2023, get 15% off when you buy 2 or more packs of OLTESPA-R3 visible-tip probes!*
Use promo code FALL23 during checkout.

The OLTESPA-R3 is a visible apex tip. Just point the free end of the cantilever at the sample feature of interest when in the navigation GUI of your AFM and hit engage.

The tip located directly beneath the cantilever apex will land in the perfect position for scanning every time!

The probe also features a tetrahedral sharpened tip with a 7nm tip radius for crisp topographic images.
A 70khz resonant frequency and 2N/m spring constant make this probe perfect for gentle imaging of samples in tapping mode whilst maintaining tip sharpness.

Suitable for a wide range of polymeric, metallic, semiconductor, ceramic and similar samples.

 

*Promotion valid thru December 31, 2023. US customers only. Shipping charges are not discounted. Promotion cannot be combined with other promotions or bulk discount rates.

Tip Specification
OLTESPA-R3 Tip Image
Tip Height (h): 9 - 19 µm
Front Angle (FA): 0 ± 1º
Back Angle (BA): 35 ±1º
Side Angle (SA): 18 ±1º
Cantilever Specification
OLTESPA-R3 Cantilever Image
Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.02 Ωcm Silicon
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.3µm
Cantilever Thickness (RNG): 1.6 - 3.0µm
Back Side Coating: Reflective Aluminum
Top Layer Back: 100 nm of Al
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