OTESPA-R3

A pack of Silicon Probes.
Quantity=10

Bruker's Value Line etched silicon probes for imaging in TappingMode™ and non-contact mode in air, with reflective coating.  This probe is also available without Aluminum reflex coating as model NCHV.

Specifications:
- 40N/m, 320kHz, Al Reflective Coating.
- Unmounted for use on any AFM.View...

Bruker AFM Probes has introduced an improved version of its popular,TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premium etched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.  

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model TESP-V2.  
View...

A wafer of high quality, etched silicon probes for TappingMode™ and other non-contact modes.  Unmounted for use on standard AFM's.

Bruker AFM Probes has introduced an improved version of its popular,TESP/TESPA AFM probes. Bruker’s new line of TESP high quality premiumetched silicon probes set the industry standard for TappingMode™ and non-contact mode in air.  

The new design provides:
•         Tighter dimensional specifications for improved probe to probe consistency
•         Tighter alignment of the tip apex to the cantilever resulting in easier laser positioning over the tip
•         Improved probe quality & aesthetics  

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model TESPW-V2.  

The current model TESPAW is available for ordering through early 2014 at which point, it will become obsolete.View...

Olympus AC240TS-R3 AFM tip.

Outstanding features of the OLTESPA-R3 visible apex tip:

1) Easily access where you want to see:
The visible apex tip is located on the very end of the cantilever. This allows you to set the tip over a point of interest on the sample, easily and precisely, especially if you use an AFM combined with an optical microscope such as the BioScope Catalyst. Click here for an example.

2) High lateral resolution:
A sharper tip is required for revealing a sample surface much more precisely. Tetrahedral shape is ideal for obtaining a point terminated tip. Actually, the radius of the curvature of the visible apex tip is very small and the average is less than 10nm even with the Aluminum reflexcoating.
The OTESPA probes cover a wide range of applications, however, it is outstanding in the observation of crystal surfaces, thin film, IC devices and so on. Click here for an example image of the high resolution capabilities of this probe.

3) Observation of rugged samples:
The tip is thin with the tip angle of 35 degrees. So this tip enables you to observe a narrower part of the sample.
Furthermore, the visible apex tip is a tilted tip, so substantial tip angle decreases more when it is attached to a chip holder in your AFM with certain tilt angle (probably, 5 to 20 degrees).The tip is effective for observing a rugged samples.

Check Scan line profile and enlarged view of the tip apex.

The current model OLTESPA is available for ordering through early 2014 at which point, it will become obsolete.

View...