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FMV-AW
Geometry
RectangularTip Radius (nm)
Nom: 8
Frequency (KHz)
Nom: 75
Min: 50
Max: 100
Length (µm)
Nom: 230
Min: 225
Max: 235
Spring Const (N/m)
Nom: 2.8
Min: 1
Max: 5
Width (µm)
Nom: 33
Min: 28
Max: 38
Price: $5,190.00 (USD)
ex vat Sold in packs of 375
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Overview
A pack of Silicon Probes.
Quantity=Wafer
Bruker's Value Line of soft TappingMode™ and Force Modulation probes, with reflective coating. This probe is also available without Aluminum reflex coating as model FMV-W.
Specifications:
- 2.8N/m, 75kHz, Al Reflective Coating.
- Unmounted for use on any AFM.
Quantity=Wafer
Bruker's Value Line of soft TappingMode™ and Force Modulation probes, with reflective coating. This probe is also available without Aluminum reflex coating as model FMV-W.
Specifications:
- 2.8N/m, 75kHz, Al Reflective Coating.
- Unmounted for use on any AFM.
Tip Specification
Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5ºº
Back Angle (BA): 15 ± 2.5ºº
Side Angle (SA): 22.5 ± 2.5ºº
Cantilever Specification
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.75µm
Cantilever Thickness (RNG): 2.0 - 3.5µm
Back Side Coating: Reflective Aluminum