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Frequency (KHz)
Nom: 75
Min: 45
Max: 115
Length (µm)
Nom: 225
Min: 235
Max: 215
Spring Const (N/m)
Nom: 2.8
Min: 0.5
Max: 9.5
Width (µm)
Nom: 28
Min: 20
Max: 35
Price: $520.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
Electrostatic Force Microscopy (EFM) probes with alignment grooves for Brukers NEOS and NEOS SENTERRA AFMs.
k = 2.8 N/m, f = 75 kHz

Tip Specification
PR-EFM10 Tip Image
Cantilever Specification
PR-EFM10 Cantilever Image
25 nm thick double layer of chromium and platinum iridium5 on both sides of the cantilever. The tip side coating enhanes the conductivity of the tip and allows for electrical contacts. The detector side coating enhances the reflectivity of the laser beam by a factor of about 2 and prevents light from interfering within the cantilever.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3µm
Cantilever Thickness (RNG): 2 - 4µm
Back Side Coating: Reflective Platinum/ Iridium
Top Layer Back: 25 nm PtIr5