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PR-MFM10

Geometry
RectangularFrequency (KHz)
Nom: 75
Min: 45
Max: 115
Length (µm)
Nom: 225
Min: 215
Max: 235
Spring Const (N/m)
Nom: 2.8
Min: 0.5
Max: 9.5
Width (µm)
Nom: 28
Min: 20
Max: 35
Price: $770.00 (USD)
Sold in packs of 10
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Overview
Magnetic Force Microscopy (MFM) mode probes with alignment grooves for Brukers NEOS and NEOS SENTERRA AFMs.
k = 2.8 N/m, f = 75 kHz
Magnetic resolution < 50 nm
k = 2.8 N/m, f = 75 kHz
Magnetic resolution < 50 nm
Tip Specification

Cantilever Specification

Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3µm
Cantilever Thickness (RNG): 2 - 4µm
Back Side Coating: Reflective Aluminum
Top Layer Back: 30 nm Al