Skip to Main Content
Close
0
AFM → NEOS/ Senterra → PR-MFM10

PR-MFM10

PR-MFM10
Geometry
Rectangular
Frequency (KHz)
Nom: 75
Min: 45
Max: 115
Length (µm)
Nom: 225
Min: 215
Max: 235
Spring Const (N/m)
Nom: 2.8
Min: 0.5
Max: 9.5
Width (µm)
Nom: 28
Min: 20
Max: 35
Price: $770.00 (USD)
Sold in packs of 10
Shipping Info
Probe Selection Guide
Email Us
Questions? Free, Online Consulting
+1 (800) 715-8440
Overview
Magnetic Force Microscopy (MFM) mode probes with alignment grooves for Brukers NEOS and NEOS SENTERRA AFMs.
k = 2.8 N/m, f = 75 kHz
Magnetic resolution < 50 nm
Tip Specification
PR-MFM10 Tip Image
Hard magnetic coating on the tip side, coercivity of approximately 300 Oe.
Cantilever Specification
PR-MFM10 Cantilever Image
The specific compositions and thicknesses of the MFM coatings are not provided because they are Veeco Proprietary. The materials and thicknesses listed are given as general guides.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3µm
Cantilever Thickness (RNG): 2 - 4µm
Back Side Coating: Reflective Aluminum
Top Layer Back: 30 nm Al
© 2021 Bruker AFM Probes, All Rights Reserved.
Loading...