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NCHV-AW

NCHV-AW
Geometry
Rectangular
Tip Radius (nm)
Nom: 8
Frequency (KHz)
Nom: 320
Min: 270
Max: 400
Length (µm)
Nom: 117
Min: 115
Max: 120
Spring Const (N/m)
Nom: 40
Min: 20
Max: 75
Width (µm)
Nom: 33
Min: 28
Max: 38
Price: $5,190.00 (USD)
Sold in packs of 375
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Questions? Free, Online Consulting
Overview
A pack of Silicon Probes.
Quantity=Wafer

Bruker's Value Line etched silicon probes for imaging in TappingMode and non-contact mode in air, with reflective coating.  This probe is also available without Aluminum reflex coating as model NCHV-W.

Specifications:
- 40N/m, 320kHz, Al Reflective Coating.
- Unmounted for use on any AFM.
Tip Specification
NCHV-AW Tip Image
Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5º
Side Angle (SA): 22.5 ± 2.5º
Cantilever Specification
NCHV-AW Cantilever Image
Aluminum reflective coating on the backside of the cantilever. The Al Reflective coating increases the laser signal (A+B) by up to 2.5 times. Although not necessary for general imaging, reflective coating is recommended for thin cantilevers, highly reflective samples, and machine vision applications.
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 3.5µm
Cantilever Thickness (RNG): 2.8 - 4.2µm
Back Side Coating: Reflective Aluminum
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