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Bruker → STR10-1800P

STR10-1800P

STR10-1800P
2 Total Related Products
STR10-180P
Calibration artifact: 18nm step height, 10µm pitch. This VLSI Surface Topography Reference Dies have a variety of Step heights and Pitchs for daily monitoring of SPM performance. The silicon die with patterned layer of SiO2 is coated with Pt. All die are 8mm x 8mm and unmounted. They are not certified or traceable to NIST.View...
STR10-440P
Calibration artifact: 44nm step height, 10µm pitch. This VLSI Surface Topography Reference Dies have a variety of Step heights and Pitchs for daily monitoring of SPM performance. The silicon die with patterned layer of SiO2 is coated with Pt. All die are 8mm x 8mm and unmounted. They are not certified or traceable to NIST.View...
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Overview
Calibration artifact, 180nm step height, 10µm pitch. This VLSI Surface Topography Reference Dies have a variety of step heights and pitches for daily monitoring of SPM performance. The silicon die with patterned layer of SiO2 is coated with Pt. All die are 8mm x 8mm and unmounted. They are not certified or traceable to NIST.
Part has been obsoleted and replaced by model VGRP-UM.
Tip Specification
Cantilever Specification
This VLSI Surface Topography Reference Dies have a variety of Step heights and Pitchs for daily monitoring of SPM performance. The silicon die with a patterned layer of SiO2 is coated with Pt. All die are 8mm x 8mm and unmounted. They are not certified or
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