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NP-OW

NP-OW
Geometry
A Triangular
Frequency (KHz)
Nom: 65
Min: 50
Max: 80
Length (µm)
Nom: 115
Min: 110
Max: 120
Spring Const (N/m)
Nom: 0.35
Min: 0.175
Max: 0.7
Width (µm)
Nom: 25
Min: 20
Max: 30
Geometry
B triangular
Frequency (KHz)
Nom: 23
Min: 16
Max: 28
Length (µm)
Nom: 200
Min: 195
Max: 205
Spring Const (N/m)
Nom: 0.12
Min: 0.06
Max: 0.24
Width (µm)
Nom: 40
Min: 35
Max: 45
Geometry
C Triangular
Frequency (KHz)
Nom: 56
Min: 40
Max: 75
Length (µm)
Nom: 115
Min: 110
Max: 120
Spring Const (N/m)
Nom: 0.24
Min: 0.12
Max: 0.48
Width (µm)
Nom: 20
Min: 15
Max: 25
Geometry
D Triangular
Frequency (KHz)
Nom: 18
Min: 12
Max: 24
Length (µm)
Nom: 200
Min: 195
Max: 205
Spring Const (N/m)
Nom: 0.06
Min: 0.03
Max: 0.12
Width (µm)
Nom: 25
Min: 20
Max: 30
Price: $3,800.00 (USD)
Sold in packs of 375
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Questions? Free, Online Consulting
Overview
A full wafer of silicon nitride cantilevers for tip customization or functionalization such as molecule or particle tips.
Tipless, 4 Cantilevers 0.06-0.35N/m; Au Reflective Coating
Tip Specification
Tipless silicon nitride cantilever for tip customization or functionalization such as molecule or particle tips.
Cantilever Specification
NP-OW Cantilever Image
Cantilever Orientation diagram can be found here.

DNP probes have less than 2deg of cantilever bend. The nominal stress specification for NP probes is less than 4deg of cantilever bend. For Bruker's Dimension SPMs, DNP is recommended.

Material: Silicon Nitride
Geometry: Triangular
Cantilevers Number: 4
Cantilever Thickness (Nom): 0.55µm
Cantilever Thickness (RNG): 0.52 - 0.58µm
Back Side Coating: Reflective Gold
Top Layer Back: 45 ± 5 nm of Ti/Au
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