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Tip Radius (nm)
Nom: 20
Max: 50
Frequency (KHz)
Nom: 75
Min: 50
Max: 100
Length (µm)
Nom: 225
Min: 200
Max: 250
Spring Const (N/m)
Nom: 2.8
Min: 1
Max: 5
Width (µm)
Nom: 28
Min: 23
Max: 33
Price: $780.00 (USD)
Sold in packs of 10
Questions? Free, Online Consulting
A pack of Magnetic Probes
Standard Moment MFM Probes with a conductive coating that can often be an excellent and cost-effective solution for electrical and capacitance microscopy.  Mounted for CPII / Innova AFMs.
Tip Specification
Coercivity: ~400 Oe. (Medium) Moment: 1e-13 EMU (Medium) The MESP is the standard probe for MFM. Since the magnetic coating is also conductive, the MESP is often an excellent cost effective choice for electrical and capacitance microscopy.
Tip Height (h): 10 - 15 µm
Front Angle (FA): 25 ± 2.5º
Back Angle (BA): 15 ± 2.5º
Side Angle (SA): 22.5 ± 2.5º
Cantilever Specification
Material: 0.01 - 0.025 Ωcm Antimony (n) doped Si
Geometry: Rectangular
Cantilevers Number: 1
Cantilever Thickness (Nom): 2.75µm
Cantilever Thickness (RNG): 2.0 - 3.5µm
Back Side Coating: Reflective CoCr