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Contact MPP
The MPP Contact cantilevers are designed for high resolution contact mode imaging.  Every aspect of the MPP design has been considered and optimized to provide the most accurate profiling of microscopic features.  With precisely controlled cantilever geometry to enable repeatable scanning parameters, and an extra sharp tip radius to reduce the AFM's minimum detectable feature size, Veeco's flagship MPP probes are an excellent choice for high sensitivity silicon probe imaging.
Contact Mode
Contact Mode is a standard AFM mode that provides the base for a host of other AFM modes. Contact mode uses a microfabricated AFM tip mounted on a cantilever. The AFM tip and sample are in constant contact during scanning. The detector signal measures cantilever deflection in Z. The output signal adjusts the Z position of the scanner to maintain the deflection setpoint when in feedback mode.
Contact Resonance

For most repeatable nanomechanics on hard samples.  All of these probes feature a wear resistant, conductive diamond coating for highest repeatability and resolution. On a Dimension Icon with FASTForce Volume Contact Resonance, these probes have been shown to provide many dozens of images with no measurable wear or change in nanomechanical values. These probes also employ Bruker’s V2 process for most consistent tip and cantilever shape, further enhancing measurement consistency. All of them employ 225um long, rectangular cantilevers, with three spring constants to address a range of sample moduli.

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