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Scanning Electrochemical Potential Microscopy (SECPM) us a sharp needle as the afm probe. Detector signal is the electric potential difference between the afm tip and sample (or between afm tip and a reference electrode) in an ionic or polar liquid, where an electric double-layer exists at the liquid/sample interface. SECPM charts the electric potential profile across the depth of the double-layer (versus Z, the tip-sample distance) at tip XY location. In feedback mode, the output signal adjusts the Z position of the scanner.
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Cantilever Specification
Tip Specification
DisplayOrder | Name | Instrument | Mount | Pack Size | Shape | Res. Freq. Nom | Res. Freq. Min | Res. Freq. Max | Spring. Const. Nom | Spring. Const. Min | Spring. Const. Max | Length Nom | Length Min | Length Max | Width Nom | Width Min | Width Max | Tip Geometry | Tip Front Angle | Tip Back Angle | Tip Side Angle | Tip Radius Nom | Tip Radius Max | Tip Set Back Nom | Tip Set Back RNG | Cantilever Geom. | Num. of Cantilevers | Cantilever Thinck. Nom. | Cantilever Thinck. RNG | Front Side Coating | Back Side Coating | Bottom Layer Front | Bottom Layer Back | Top Layer Front | Top Layer Back | Base Price |
0000000690 |
PT-ECM10
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N/A
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Unmounted
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10
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N/A
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N/A
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0kHz
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0kHz
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0N/m
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0N/m
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0N/m
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0µm
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0µm
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0µm
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0µm
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0µm
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0µm
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Solid Wire
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N/A
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N/A
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N/A
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N/A
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N/A
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N/A
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N/A
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Special
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1
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N/A
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N/A
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N/A
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N/A
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N/A
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N/A
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N/A
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N/A
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00000275.00$275.00 (USD)
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0000001850 |
TT-ECM10
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N/A
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Unmounted
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10
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N/A
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N/A
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0kHz
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0kHz
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0N/m
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0N/m
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0N/m
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0µm
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0µm
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0µm
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0µm
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0µm
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0µm
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Solid Wire
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N/A
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N/A
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N/A
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N/A
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N/A
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N/A
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N/A
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Special
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1
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N/A
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N/A
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N/A
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N/A
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N/A
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N/A
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N/A
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N/A
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00000335.00$335.00 (USD)
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