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Surface Potential Microscopy (SPoM)
Surface Potential Microscopy (SPoM)provides the capability to measure surface topography and surface potential (VDC) information simultaneously. Based on the macroscopic Kelvin method, a conductive afm tip is used to acquire topography   using TappingMode™ while the electrical information is extracted by applying AC and DC voltages to the afm tip. The total voltage acting on the tip is: V = VDC + VAC sin (Ω t). A dedicated feedback loop adjusts the DC voltage to the tip to zero the contact potential difference between the tip and surface at each pixel, making DC a measure of the surface potential. This versatile technique can be accomplished using LiftMode™ or in a dual-frequency one-pass fashion.
Tip Enhanced Raman Spectroscopy (TERS)
Tip Enhanced Raman Spectroscopy (TERS) is a technique that uses the Raman effect to provide chemical identification.  The sample is illuminated with a monochromatic laser source, and the backscattered radiation is dispersed to obtain the spectral information.  TERS uses the sPM tip as a near field antenna, thus providing much higher spatial resolution (10 nm).  TERS expands the application of AFM beyond topographical imaging, and couples it with true nanoscale spectral information.
Scanning Microwave Impedance Microscopy (sMIM)
Scanning Microwave Impedance Microscopy (sMIM) produces high quality images of local electrical properties with better than 50nm resolution. The technical approach is to utilize microwave reflections from a nm scale region of the sample directly under the MIM probe. The magnitude and phase of these reflections is dominated by the local electrical properties. The ScanWave sMIM measures these reflections as a function of position to create images of variations in dielectric constant and conductivity.
Chemical Force Microscopy (CFM)
Chemical Force Microscopy (CFM) combines the force sensitivity and high special resolution of the atomic force microscope (AFM) with the possibility of chemical discrimination. This unique combination is achieved by well-defined chemical modification of the AFM probe tip with specific functional groups.
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