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Electrostatic Force Microscopy (EFM)
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Category
- Probes (9)
Application
- Electrical (2)
- General Topography (7)
- Mechanical Force Curves (5)
Mode
- Contact Mode (3)
- Contact Resonance (1)
- Electrical Spectroscopy (2)
- Electrostatic Force Microscopy (EFM) (2)
- Force Modulation (3)
- PeakForce Tapping (3)
- Scanning Spreading Resistance Mode (SSRM) (2)
- TappingMode/ Non-Contact (6)
- Torsional Resonance (TR) (2)
Sample
- Ceramics (4)
- Data Storage (3)
- Other Hard Samples (9)
- Other Soft Sample (6)
- Polymers (9)
- Semiconductors (3)
Probe Manufacturers
- Bruker (8)
- Olympus (1)
AFM
- AFM-IR (1)
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- Dimension IconIR 300 (1)
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- NanoWizard 4XP & V (3)
- NanoWizard ULTRA Speed (3)
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- Non-Bruker AFM (9)
- Vx and UVx (1)
Spring Constant
- 1-15 N/m (5)
- 15-50 N/m (3)
- 50 N/m & up (1)
Resonant Frequency
- 51-100 kHz (4)
- 101-200 kHz (4)
- 401-600 kHz (1)
Tip Radius
- Sharp 3nm-10nm (7)
- Large >50nm (2)
Cantilever Geometry
- Rectangular (9)
Cantilever Coating
- (6)
- Reflective Aluminum (3)
Tip Geometry
- Standard (Steep) (8)
- Tetrahedral (1)
Tip Coating
- (7)
- Conductive Diamond (2)
Number of Cantilevers
- 1 (9)