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Probes → Modes and Applications → Electrical Applications → Electrostatic Force Microscopy (EFM)

Electrostatic Force Microscopy (EFM)

LTESPW-V2
Frequency
Nom: 190KHz
Spring Const.
Nom: 48N/m
Geometry
Rectangular
Tip Radius
8nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
LTESPAW-V2
Frequency
Nom: 190KHz
Spring Const.
Nom: 48N/m
Geometry
Rectangular
Tip Radius
8nm
Material
0.01 - 0.025 Ωcm Antimony (n) doped Si
Coating
B: Reflective Aluminum
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