Your shopping cart is currently empty.
Surface Potential Microscopy (SPoM)
Surface Potential Microscopy (SPoM)provides the capability to measure surface topography and surface potential (VDC) information simultaneously. Based on the macroscopic Kelvin method, a conductive afm tip is used to acquire topography using TappingMode™ while the electrical information is extracted by applying AC and DC voltages to the afm tip. The total voltage acting on the tip is: V = VDC + VAC sin (Ω t). A dedicated feedback loop adjusts the DC voltage to the tip to zero the contact potential difference between the tip and surface at each pixel, making DC a measure of the surface potential. This versatile technique can be accomplished using LiftMode™ or in a dual-frequency one-pass fashion.