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Electrical Spectroscopy
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Category
- Probes (9)
Application
- Electrical (13)
Mode
- Conductive AFM (CAFM) (9)
- Contact Resonance (1)
- Electrical Spectroscopy (13)
- Electrostatic Force Microscopy (EFM) (13)
- Magnetic Force Microscopy (MFM) (1)
- PeakForce TUNA (1)
- Piezoresponse/ Piezoforce Microscopy (PFM) (10)
- Scanning Capacitance Mode (SCM) (5)
- Scanning Spreading Resistance Mode (SSRM) (5)
- Surface Potential Microscopy (SPoM) (10)
- TappingMode/ Non-Contact (1)
- Torsional Resonance (TR) (1)
- Tunneling AFM (TUNA) (9)
Sample
- Ceramics (4)
- Data Storage (8)
- Other Hard Samples (13)
- Other Soft Sample (9)
- Polymers (12)
- Semiconductors (12)
Probe Manufacturers
- Bruker (9)
- Rocky Mountain Nanotechnology (4)
AFM
- BioScope (4)
- BioScope Catalyst (4)
- Caliber (13)
- Dimension FastScan (2)
- Dimension Icon (13)
- Dimension XR (13)
- Dimension (Other) (13)
- EnviroScope (12)
- Innova (13)
- MultiMode (13)
- NanoWizard 4XP & V (4)
- NanoWizard ULTRA Speed (4)
- Non-Bruker AFM (13)
Spring Constant
- 0.05-1 N/m (4)
- 1-15 N/m (6)
- 15-50 N/m (2)
- 50 N/m & up (1)
Resonant Frequency
- 0-51 kHz (7)
- 51-100 kHz (4)
- 101-200 kHz (1)
- 401-600 kHz (1)
Tip Radius
- Medium 11nm-50nm (6)
- Large >50nm (3)
Cantilever Geometry
- Rectangular (13)
Cantilever Coating
- (5)
- Reflective Aluminum (2)
Tip Geometry
- Pyramid (1)
- Rotated (2)
- Solid Wire (4)
- Standard (Steep) (6)
Tip Coating
- (7)
- Conductive Diamond (2)
- Conductive PtSi (1)
- Magnetic (1)
- PtIr (2)
Number of Cantilevers
- 1 (12)
- 3 (1)