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General Topography
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Category
- Probes (76)
Application
- Electrical (4)
- Fluid Imaging (17)
- General Topography (77)
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Mode
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Sample
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Probe Manufacturers
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AFM
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Spring Constant
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- 1-15 N/m (18)
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- 50 N/m & up (3)
Resonant Frequency
- 0-51 kHz (18)
- 51-100 kHz (21)
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- 401-600 kHz (5)
- 601 kHz + (2)
Tip Radius
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- Medium 11nm-50nm (18)
Cantilever Geometry
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Cantilever Coating
- (33)
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Tip Coating
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Number of Cantilevers
- 1 (65)
- 4 (6)
- 6 (6)