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Piezoresponse/ Piezoforce Microscopy (PFM)
Piezoforce Microscopy (PFM) is a technique based on contact mode. PFM identifies the inverse piezoelectric effect of a sample by electrically stimulating the sample so the topographic response of the sample can be monitored by lock-in techniques. Amplitude and phase information show details such as the strength and direction of the polarization on the sample.
Scanning Electrochemical Potential Microscopy (SECPM)
Scanning Electrochemical Potential Microscopy (SECPM) us a sharp needle as the afm probe. Detector signal is the electric potential difference between the AFM tip and sample (or between afm tip and a reference electrode) in an ionic or polar liquid, where an electric double-layer exists at the liquid/sample interface. SECPM charts the electric potential profile across the depth of the double-layer (versus Z, the tip-sample distance) at tip XY location. In feedback mode, the output signal adjusts the Z position of the scanner.
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