For All AFMs

VITA nTA Calibration Sample Set

STS3-180P

Calibration artifact: 18nm step height, 3/10/20µm pitch, NIST traceable

STR3-180P

Calibration artifact: 18nm step height, 3µm pitch

STS3-440P

Calibration artifact: 44nm step height, 3/10/20µm pitch, NIST traceable

STR3-440P

Calibration artifact: 44nm step height, 3µm pitch

STS3-1800P

Calibration artifact: 180nm step height, 3/10/20µm pitch, NIST traceable

STR3-1800P

Calibration artifact: 180nm step height, 3µm pitch

STR10-180P

Calibration artifact: 18nm step height, 10µm pitch

VITA Scanning Thermal Microscopy, SThM, test sample